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[IEEE Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) - Kuala Lumpur, Malaysia (2006.01.17-2006.01.19)] Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) - Current testable design of resistor string DACs

Hashizume, M., Nishida, T., Yotsuyanagi, H., Tamesada, T., Miura, Y.
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Year:
2006
Language:
english
DOI:
10.1109/delta.2006.28
File:
PDF, 224 KB
english, 2006
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