[IEEE IEEE International Conference on Test, 2005. -...

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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - A 16-bit resistor string dac with full-calibration at final test

Parthasarathy, K., Kuyel, T., Zhongjun Yu,, Degang Chen,, Geiger, R.
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Year:
2005
Language:
english
DOI:
10.1109/test.2005.1583962
File:
PDF, 640 KB
english, 2005
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