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[IEEE Comput. Soc. Press IEEE International Conference on Computer Aided Design (ICCAD) - San Jose, CA, USA (5-9 Nov. 1995)] Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) - Pattern generation for a deterministic BIST scheme

Hellebrand, S., Reeb, B., Tarnick, S., Wunderlich, H.-J.
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Year:
1995
Language:
english
DOI:
10.1109/iccad.1995.479997
File:
PDF, 718 KB
english, 1995
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