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Determination of traps in poly(p-phenylene vinylene) light emitting diodes by charge-based deep level transient spectroscopy
Gaudin, Olivier, Jackman, Richard B, Nguyen, Thien-Phap, Le Rendu, PhilippeVolume:
90
Year:
2001
Language:
english
DOI:
10.1063/1.1403669
File:
PDF, 398 KB
english, 2001