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[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability
Richter, Michael, Oberlaender, Klaus, Goessel, MichaelYear:
2008
Language:
english
DOI:
10.1109/iolts.2008.27
File:
PDF, 264 KB
english, 2008