![](/img/cover-not-exists.png)
[IEEE AUTOTESTCON 2004. - San Antonio, TX, USA (20-23 Sept. 2004)] Proceedings AUTOTESTCON 2004. - Extracting masked signal parameters with a synthetic instrument
Robert Wade Lowdermilk,, Fredric J. Harris,Year:
2004
Language:
english
DOI:
10.1109/autest.2004.1436806
File:
PDF, 1.01 MB
english, 2004