The structure and mass of heterogeneous thin films measured...

The structure and mass of heterogeneous thin films measured with dual polarization interferometry and ellipsometry

Coffey, Paul David, Swann, Marcus Jack, Waigh, Thomas Andrew, Mu, Qingshan, Lu, Jian Ren
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Volume:
3
Year:
2013
Language:
english
Journal:
RSC Advances
DOI:
10.1039/c2ra22911k
File:
PDF, 938 KB
english, 2013
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