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The structure and mass of heterogeneous thin films measured with dual polarization interferometry and ellipsometry
Coffey, Paul David, Swann, Marcus Jack, Waigh, Thomas Andrew, Mu, Qingshan, Lu, Jian RenVolume:
3
Year:
2013
Language:
english
Journal:
RSC Advances
DOI:
10.1039/c2ra22911k
File:
PDF, 938 KB
english, 2013