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[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Reducing power consumption in memory ECC checkers
Ghosh, S., Basu, S., Touba, N.A.Year:
2004
Language:
english
DOI:
10.1109/test.2004.1387407
File:
PDF, 672 KB
english, 2004