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Measurement of Minority Carrier Lifetime inn-Type MBE HgCdTe on Variable Substrates
P.G. Maloney, R. DeWames, J.G. Pellegrino, C. Billman, J.M. Arias, D.D. Edwall, D. Lee, J. KhurginVolume:
41
Language:
english
DOI:
10.1007/s11664-012-2062-1
Date:
October, 2012
File:
PDF, 515 KB
english, 2012