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Study of Macrodefects in MBE-Grown HgCdTe Epitaxial Layers Using Focused Ion Beam Milling
M. Reddy, J. Wilde, J. M. Peterson, D.D. Lofgreen, S.M. JohnsonVolume:
41
Language:
english
DOI:
10.1007/s11664-012-2122-6
Date:
October, 2012
File:
PDF, 943 KB
english, 2012