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Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation
Yerci, S., Yildiz, I, Kulakci, M., Serincan, U., Barozzi, M., Bersani, M., Turan, R.Volume:
102
Year:
2007
Language:
english
DOI:
10.1063/1.2756622
File:
PDF, 583 KB
english, 2007