Depth profile investigations of silicon nanocrystals formed...

Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation

Yerci, S., Yildiz, I, Kulakci, M., Serincan, U., Barozzi, M., Bersani, M., Turan, R.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
102
Year:
2007
Language:
english
DOI:
10.1063/1.2756622
File:
PDF, 583 KB
english, 2007
Conversion to is in progress
Conversion to is failed