Atomic force microscopy and photoluminescence analysis of...

Semiconductors 2012 / 12 Vol. 46; Iss. 13

Atomic force microscopy and photoluminescence analysis of porous metal-oxide materials

Tarasov, S. A., Gracheva, I. E., Gareev, K. G., Gordyushenkov, O. E., Lamkin, I. A., Men’kovich, E. A., Moshnikov, V. A., Presnyakova, A. V.
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Volume:
46
Language:
english
Journal:
Semiconductors
DOI:
10.1134/s1063782612130167
Date:
December, 2012
File:
PDF, 459 KB
english, 2012
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