A test structure advisor and a coupled, library-based test...

IEEE Transactions on Semiconductor Manufacturing 1997 Vol. 10; Iss. 3

A test structure advisor and a coupled, library-based test structure layout and testing environment

Kumar, M.V., Lukaszek, W., Plummer, J.D.
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Volume:
10
Year:
1997
Language:
english
DOI:
10.1109/66.618210
File:
PDF, 629 KB
english, 1997
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