Photoelectric probing of the interfacial trap...

Physical Chemistry Chemical Physics 2013 Vol. 15; Iss. 8

Photoelectric probing of the interfacial trap density-of-states in ZnO nanowire field-effect transistors

Raza, Syed Raza Ali, Lee, Young Tack, Chang, Youn-Gyoung, Jeon, Pyo Jin, Kim, Jae Hoon, Ha, Ryong, Choi, Heon-Jin, Im, Seongil
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Volume:
15
Year:
2013
Language:
english
Journal:
Physical Chemistry Chemical Physics
DOI:
10.1039/c3cp44027c
File:
PDF, 1.03 MB
english, 2013
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