[IEEE Comput. Soc Design, Automation and Test in Europe Conference and Exhibition - Paris, France (16-20 Feb. 2004)] Proceedings Design, Automation and Test in Europe Conference and Exhibition - System level power modeling and simulation of high-end industrial network-on-chip
Bona, A., Zaccaria, V., Zafalon, R.Year:
2004
Language:
english
DOI:
10.1109/date.2004.1269258
File:
PDF, 315 KB
english, 2004