[IEEE 2012 IEEE International Test Conference (ITC 2012 ) -...

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[IEEE 2012 IEEE International Test Conference (ITC 2012 ) - Anaheim, CA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - On-chip diagnosis for early-life and wear-out failures

Beckler, M., Blanton, R. D.
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Year:
2012
Language:
english
DOI:
10.1109/test.2012.6401580
File:
PDF, 470 KB
english, 2012
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