[IEEE 2008 Second International Symposium on Intelligent Information Technology Application (IITA) - Shanghai, China (2008.12.20-2008.12.22)] 2008 Second International Symposium on Intelligent Information Technology Application - SVM Classifier for Analog Fault Diagnosis Using Fractal Features
Mao, Xianbai, Wang, Liheng, Li, ChangxiYear:
2008
Language:
english
DOI:
10.1109/iita.2008.249
File:
PDF, 363 KB
english, 2008