Charge transport properties of insulators revealed by surface potential decay experiment and bipolar charge transport model with genetic algorithm
Daomin Min,, Mengu Cho,, Shengtao Li,, Khan, A. R.Volume:
19
Language:
english
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/tdei.2012.6396982
Date:
December, 2012
File:
PDF, 954 KB
english, 2012