SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Tuesday 13 May 1997)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 - Effect of impurities on the value of the bulk laser damage threshold of KDP single crystals
Salo, Vitaly I., Kolybayeva, Marina I., Puzikov, Viacheslav M., Pritula, Igor M., Vasil'chuk, V. G., Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
3359
Year:
1998
Language:
english
DOI:
10.1117/12.306278
File:
PDF, 353 KB
english, 1998