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Failure Analysis and Radiation-Enabled Circuit Simulation of a Dual Charge Pump Circuit
Schlenvogt, Garrett James, Barnaby, Hugh J., Esqueda, Ivan S., Holbert, Keith E., Wilkinson, Jeff, Morrison, Scott, Tyler, LarryLanguage:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2010.2079951
Date:
December, 2010
File:
PDF, 643 KB
english, 2010