[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - A Switch Box Architecture to Mitigate Bridging and Short Faults in SRAM-Based FPGAs
Ebrahimi, Hassan, Zamani, Morteza Saheb, Razavi, Seyyed AhmadYear:
2010
Language:
english
DOI:
10.1109/dft.2010.33
File:
PDF, 169 KB
english, 2010