Nitrogen-passivated dielectric/InGaAs interfaces with...

Nitrogen-passivated dielectric/InGaAs interfaces with sub-nm equivalent oxide thickness and low interface trap densities

Chobpattana, Varistha, Son, Junwoo, Law, Jeremy J. M., Engel-Herbert, Roman, Huang, Cheng-Ying, Stemmer, Susanne
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
102
Year:
2013
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4776656
File:
PDF, 1.22 MB
english, 2013
Conversion to is in progress
Conversion to is failed