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[IEEE 2010 5th International Conference on Future Information Technology - Busan, Korea (South) (2010.05.21-2010.05.23)] 2010 5th International Conference on Future Information Technology - The Dual Verifying VSS Scheme Based on Digital Signature and Halftone Logo
Lin, Chia-Chen, Chang, Chin-Chen, Le, T. Hoang Ngan, Le, Hoai BacYear:
2010
Language:
english
DOI:
10.1109/futuretech.2010.5482733
File:
PDF, 788 KB
english, 2010