[IEEE Proceedings of 1995 IEEE International Reliability Physics Symposium - Las Vegas, NV (1995.04.4-1995.04.6)] 33rd IEEE International Reliability Physics Symposium - OBIC analysis of stressed, thermally-isolated polysilicon resistors
Cole, E.I., Suehle, J.S., Peterson, K.A., Chaparala, P., Campbell, A.N., Snyder, E.S., Pierce, D.G.Year:
1995
Language:
english
DOI:
10.1109/relphy.1995.513685
File:
PDF, 2.02 MB
english, 1995