[IEEE Proceedings of 1995 IEEE International Reliability...

  • Main
  • [IEEE Proceedings of 1995 IEEE...

[IEEE Proceedings of 1995 IEEE International Reliability Physics Symposium - Las Vegas, NV (1995.04.4-1995.04.6)] 33rd IEEE International Reliability Physics Symposium - OBIC analysis of stressed, thermally-isolated polysilicon resistors

Cole, E.I., Suehle, J.S., Peterson, K.A., Chaparala, P., Campbell, A.N., Snyder, E.S., Pierce, D.G.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
1995
Language:
english
DOI:
10.1109/relphy.1995.513685
File:
PDF, 2.02 MB
english, 1995
Conversion to is in progress
Conversion to is failed