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High temperature breakdown strength and voltage endurance characterization of nanofilled polyamideimide
Schadler, L. S., Nelson, J. K., Calebrese, C., Travelpiece, A., Schweickart, D. L.Volume:
19
Language:
english
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/tdei.2012.6396969
Date:
December, 2012
File:
PDF, 3.67 MB
english, 2012