Total dose hardness of three commercial CMOS...

IEEE Transactions on Nuclear Science 1998 / 6 Vol. 45; Iss. 3

Total dose hardness of three commercial CMOS microelectronics foundries

Osborn, J.V., Lacoe, R.C., Mayer, D.C., Yabiku, G.
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Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.685223
Date:
June, 1998
File:
PDF, 618 KB
english, 1998
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