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[IEEE 2006 International Conference on Simulation of Semiconductor Processes and Devices - Monterey, CA, USA (2006.09.6-2006.09.8)] 2006 International Conference on Simulation of Semiconductor Processes and Devices - 3-Dimensional Analysis on the GIDL Current of Body-tied Triple Gate FinFET
Byun, Hyun-sook, Lee, Won-sok, Lee, Jin-woo, Lee, Keun-ho, Park, Young-kwan, Kong, Jeong-taekYear:
2006
Language:
english
DOI:
10.1109/sispad.2006.282887
File:
PDF, 3.44 MB
english, 2006