[IEEE 2006 International Conference on Simulation of...

  • Main
  • [IEEE 2006 International Conference on...

[IEEE 2006 International Conference on Simulation of Semiconductor Processes and Devices - Monterey, CA, USA (2006.09.6-2006.09.8)] 2006 International Conference on Simulation of Semiconductor Processes and Devices - 3-Dimensional Analysis on the GIDL Current of Body-tied Triple Gate FinFET

Byun, Hyun-sook, Lee, Won-sok, Lee, Jin-woo, Lee, Keun-ho, Park, Young-kwan, Kong, Jeong-taek
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2006
Language:
english
DOI:
10.1109/sispad.2006.282887
File:
PDF, 3.44 MB
english, 2006
Conversion to is in progress
Conversion to is failed