[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Approximations to field-effect factor and their use in GIDL modeling
Kozhukhov, Nikita, Byoungchan Oh,, Hyungcheol Shin,Year:
2011
Language:
english
DOI:
10.1109/ipfa.2011.5992740
File:
PDF, 285 KB
english, 2011