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[IEEE 2012 IEEE International Symposium on Circuits and Systems - ISCAS 2012 - Seoul, Korea (South) (2012.05.20-2012.05.23)] 2012 IEEE International Symposium on Circuits and Systems - Digital background calibration of redundant split-flash ADC in 45nm CMOS
Majidi, Rabeeh, Crasso, Anthony, McNeill, John A.Year:
2012
Language:
english
DOI:
10.1109/iscas.2012.6271469
File:
PDF, 937 KB
english, 2012