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[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Radiation effects upon the mismatch of identically laid out transistor pairs
Verbeeck, Jens, Leroux, Paul, Steyaert, MichielYear:
2011
Language:
english
DOI:
10.1109/icmts.2011.5976845
File:
PDF, 380 KB
english, 2011