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Investigation for Resistive Switching by Controlling Overflow Current in Resistance Change Nonvolatile Memory
Ahn, Seung-Eon, Lee, Myoung-Jae, Kang, Bo Soo, Lee, Dongsoo, Kim, Chang-Jung, Kim, Dong-Sik, Chung, U-InVolume:
11
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/tnano.2012.2214788
Date:
November, 2012
File:
PDF, 336 KB
english, 2012