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SPIE Proceedings [SPIE OPTO - San Francisco, California (Saturday 23 January 2010)] Silicon Photonics V - Preliminary radiation hardness tests of single photon Si detectors
Pagano, R., Libertino, S., Valvo, G., Condorelli, G., Carbone, B., Piana, A., Mazzillo, M., Sanfilippo, D. N., Fallica, P. G., Principato, F., Cannella, G., Falci, G., Lombardo, S., Kubby, Joel A., ReVolume:
7606
Year:
2010
Language:
english
DOI:
10.1117/12.841740
File:
PDF, 739 KB
english, 2010