Resonant spectrum method to characterize piezoelectric...

Resonant spectrum method to characterize piezoelectric films in composite resonators

Yuxing Zhang, Zuoqing Wang, Cheeke, J.D.N.
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Volume:
50
Year:
2003
Language:
english
DOI:
10.1109/tuffc.2003.1193626
File:
PDF, 1.72 MB
english, 2003
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