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Mechanical milling-induced deformation twinning in Fcc materials with high stacking fault energy
Jianhong He, Kyung H. Chung, Enrique J. Lavernia, Xiaozhou Liao, Yuntian T. ZhuVolume:
34
Language:
english
DOI:
10.1007/s11661-003-0106-0
Date:
March, 2003
File:
PDF, 1.36 MB
english, 2003