Determination by interferometric methods of the thickness...

Determination by interferometric methods of the thickness of the reference system used in microradiography

O. Hallén, E. Ingelstam
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Volume:
3
Year:
1952
Language:
english
DOI:
10.1016/0014-4827(52)90047-5
File:
PDF, 68 KB
english, 1952
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