Diagnostic studies of a-Si:H image devices by the aid of transient photocurrent measurement
Takayuki Yagi, Shin-ichi Terazono, Ryohei Miyagawa, Isamu ShimizuVolume:
59-60
Year:
1983
Language:
english
DOI:
10.1016/0022-3093(83)90389-7
File:
PDF, 174 KB
english, 1983