Diagnostic studies of a-Si:H image devices by the aid of...

Diagnostic studies of a-Si:H image devices by the aid of transient photocurrent measurement

Takayuki Yagi, Shin-ichi Terazono, Ryohei Miyagawa, Isamu Shimizu
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Volume:
59-60
Year:
1983
Language:
english
DOI:
10.1016/0022-3093(83)90389-7
File:
PDF, 174 KB
english, 1983
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