X rays and raman sensitivity differences in heterogeneous...

X rays and raman sensitivity differences in heterogeneous a-Si:H from pure L.P.C.V.D.

Etienne Bustarret, Alain Deneuville, Hervé Roux-Buisson, Louis Brunel
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Volume:
59-60
Year:
1983
Language:
english
DOI:
10.1016/0022-3093(83)90557-4
File:
PDF, 173 KB
english, 1983
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