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X rays and raman sensitivity differences in heterogeneous a-Si:H from pure L.P.C.V.D.
Etienne Bustarret, Alain Deneuville, Hervé Roux-Buisson, Louis BrunelVolume:
59-60
Year:
1983
Language:
english
DOI:
10.1016/0022-3093(83)90557-4
File:
PDF, 173 KB
english, 1983