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Structural analysis of Na2OGa2O3SiO2 glasses by the X-ray diffraction method
Nobuya Iwamoto, Norimasa Umesaki, Shigeru Goto, Teiichi Hanada, Naohiro SogaVolume:
70
Year:
1985
Language:
english
DOI:
10.1016/0022-3093(85)90101-2
File:
PDF, 379 KB
english, 1985