Determination of the mobility gap in amorphous silicon from a low temperature photoconductivity measurement
M. Vaněček, J. Stuchlík, J. Kočka, A. TřískaVolume:
77-78
Year:
1985
Language:
english
DOI:
10.1016/0022-3093(85)90660-x
File:
PDF, 193 KB
english, 1985