The role of interface states in the evaluation of density of states from field effect measurements in dc-sputtered a-Si:H
Václav Šmíd, Jiří Mareš, Nguyen M. Dung, Ladislav Štourač, Jozef KrištofikVolume:
77-78
Year:
1985
Language:
english
DOI:
10.1016/0022-3093(85)90663-5
File:
PDF, 166 KB
english, 1985