Degradation of photoresponse time of a-Si:H and correlation with NI measured by low frequency C-V method
Kohji Mori, Eiichi Ohta, Masumitsu Ino, Katsuhiko TaniVolume:
77-78
Year:
1985
Language:
english
DOI:
10.1016/0022-3093(85)90688-x
File:
PDF, 140 KB
english, 1985