Noise measurements in thin films of amorphous silicon

Journal of Non-Crystalline Solids 1985 Vol. 77-78; Iss. part-P1

Noise measurements in thin films of amorphous silicon

Arnaldo D'Amico, Guglielmo Fortunato, C.M van Vliet
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Volume:
77-78
Year:
1985
Language:
english
DOI:
10.1016/0022-3093(85)90707-0
File:
PDF, 162 KB
english, 1985
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