The determination of characteristic parameters by the temperature dependent field-effect in a-Si:H thin film transistors
R.E.I. Schropp, G.J.M. Brouwer, J.F. VerweyVolume:
77-78
Year:
1985
Language:
english
DOI:
10.1016/0022-3093(85)90710-0
File:
PDF, 167 KB
english, 1985