Asymmetric versus symmetric dimerization on the Si(001) and As/Si(001)2 × 1 reconstructed surfaces as observed by grazing incidence X-ray diffraction
N. Jedrecy, M. Sauvage-Simkin, R. Pinchaux, J. Massies, N. Greiser, V.H. EtgensVolume:
230
Year:
1990
Language:
english
DOI:
10.1016/0039-6028(90)90027-6
File:
PDF, 687 KB
english, 1990