Photoemission and x-ray diffraction study of the ErSi(111)...

Surface Science 1990 Vol. 237; Iss. 1-3

Photoemission and x-ray diffraction study of the ErSi(111) interface

Shubha Gokhale, Shailaja Mahamuni, S.V. Deshmukh, V.J. Rao, A.S. Nigavekar, S.K. Kulkarni
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Volume:
237
Year:
1990
Language:
english
DOI:
10.1016/0039-6028(90)90525-d
File:
PDF, 577 KB
english, 1990
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