Si K-edge and Ge K-edge X-ray absorption spectroscopy of...

Surface Science 1993 Vol. 291; Iss. 3

Si K-edge and Ge K-edge X-ray absorption spectroscopy of the SiGe interface in [(Si)m(Ge)n]p atomic layer superlattices

A.P. Hitchcock, T. Tyliszczak, P. Aebi, J.Z. Xiong, T.K. Sham, K.M. Baines, K.A. Mueller, X.H. Feng, J.M. Chen, B.X. Yang, Z.H. Lu, J.-M. Baribeau, T.E. Jackman
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
291
Year:
1993
Language:
english
DOI:
10.1016/0039-6028(93)90453-q
File:
PDF, 1.98 MB
english, 1993
Conversion to is in progress
Conversion to is failed