X-ray photoelectron diffraction from ultra-thin Cr layers...

Surface Science 1993 Vol. 287-288; Iss. part-P2

X-ray photoelectron diffraction from ultra-thin Cr layers on Au(100) and Ag(100): a comparison

D. Rouyer, C. Krembel, M.C. Hanf, D. Bolmont, G. Gewinner
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Volume:
287-288
Year:
1993
Language:
english
DOI:
10.1016/0039-6028(93)91103-v
File:
PDF, 517 KB
english, 1993
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