X-ray diffraction from anodic TiO2 films: in situ and ex...

Surface Science 1994 Vol. 302; Iss. 3

X-ray diffraction from anodic TiO2 films: in situ and ex situ comparison of the Ti (0001) face

David G. Wiesler, Michael F. Toney, Owen R. Melroy, Christopher S. McMillan, William H. Smyrl
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Volume:
302
Year:
1994
Language:
english
DOI:
10.1016/0039-6028(94)90838-9
File:
PDF, 880 KB
english, 1994
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