Be delta-doped layers in GaAs studied by scanning...

Materials Science and Engineering: B 1995 Vol. 35; Iss. 1-3

Be delta-doped layers in GaAs studied by scanning tunnelling microscopy

P.M. Koenraad, M.B. Johnson, H.W.M. Salemink, W.C. van der Vleuten, J.H. Wolter
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Volume:
35
Year:
1995
Language:
english
DOI:
10.1016/0921-5107(95)01436-5
File:
PDF, 294 KB
english, 1995
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