Effects of X-ray radiation on hydrogenated amorphous...

Current Applied Physics 2010 Vol. 10; Iss. 1

Effects of X-ray radiation on hydrogenated amorphous silicon thin-film transistors and characteristics of tungsten shield layer

Hee-suk Pang, Yun-sik Jeong, Hong-Seok Choi, Chang-Wook Han, Yoon-Heung Tak, Byung-Chul Ahn
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Volume:
10
Year:
2010
Language:
english
DOI:
10.1016/j.cap.2009.05.015
File:
PDF, 311 KB
english, 2010
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